http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9500703-B2

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
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filingDate 2014-08-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d1a06d05c9a0b3686f9fd0d64b9a720a
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publicationDate 2016-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9500703-B2
titleOfInvention Semiconductor structure having test device
abstract There is set forth herein a semiconductor structure including a plurality of test devices, the plurality of test devices including a first test device and a second test device. A semiconductor structure can also include a waveform generating circuit, the waveform generating circuit configured for application of a first stress signal waveform having a first duty cycle to the first test device, and a second stress signal waveform having a second duty cycle to the second test device. A semiconductor structure can include a selection circuit associated with each of the first test device and the second test device for switching between a stress cycle and a sensing cycle.
priorityDate 2014-08-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.