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publicationDate 2016-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9484426-B2
titleOfInvention Metal contacts to group IV semiconductors by inserting interfacial atomic monolayers
abstract Techniques for reducing the specific contact resistance of metal-semiconductor (group IV) junctions by interposing a monolayer of group V or group III atoms at the interface between the metal and the semiconductor, or interposing a bi-layer made of one monolayer of each, or interposing multiple such bi-layers. The resulting low specific resistance metal—group IV semiconductor junctions find application as a low resistance electrode in semiconductor devices including electronic devices (e.g., transistors, diodes, etc.) and optoelectronic devices (e.g., lasers, solar cells, photodetectors, etc.) and/or as a metal source and/or drain region (or a portion thereof) in a field effect transistor (FET). The monolayers of group III and group V atoms are predominantly ordered layers of atoms formed on the surface of the group IV semiconductor and chemically bonded to the surface atoms of the group IV semiconductor.
priorityDate 2011-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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