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filingDate 2015-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2016-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9472642-B2
titleOfInvention Method of forming a semiconductor device structure and such a semiconductor device structure
abstract The present disclosure provides in one aspect for a semiconductor device structure which may be formed by providing source/drain regions within a semiconductor substrate in alignment with a gate structure formed over the semiconductor substrate, wherein the gate structure has a gate electrode structure, a first sidewall spacer and a second sidewall spacer, the first sidewall spacer covering sidewall surfaces of the gate electrode structure and the sidewall spacer being formed on the first sidewall spacer. Furthermore, forming the semiconductor device structure may include removing the second sidewall spacer so as to expose the first sidewall spacer, forming a third sidewall spacer on a portion of the first sidewall spacer such that the first sidewall spacer is partially exposed, and forming silicide regions in alignment with the third sidewall spacer in the source/drain regions.
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