http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9099380-B2

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filingDate 2014-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2015-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2015-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9099380-B2
titleOfInvention Method of forming step doping channel profile for super steep retrograde well field effect transistor and resulting device
abstract A methodology enabling the formation of steep channel profiles for devices, such as SSRW FETs, having a resultant channel profiles that enables suppression of threshold voltage variation and the resulting device are disclosed. Embodiments include providing STI regions in a silicon wafer; performing a deep well implantation of a dopant into the silicon wafer between STI regions; forming a recess in the doped silicon wafer between the STI regions; performing a shallow well implantation of the dopant into the silicon wafer in the recess; and forming Si:C on the doped silicon wafer in the recess.
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Total number of triples: 41.