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filingDate 2012-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2015-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5deae41824ebc09e0ce38990488a4402
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publicationDate 2015-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9059308-B2
titleOfInvention Method of manufacturing dummy gates of a different material as insulation between adjacent devices
abstract Embodiments of the present invention include a semiconductor structure including two transistor structures separated by a dummy gate of a different material and methods for forming said structure. Embodiments including forming sacrificial gates on a semiconductor substrate, forming spacers on the sacrificial gates, forming source/drain regions adjacent to two sacrificial gates separated by a third sacrificial gate, and replacing the third sacrificial gate with an insulating material. The insulating material replacing the third sacrificial gate may serve as a dummy gate to electrically isolate nearby source/drain regions. Embodiments further include forming sacrificial gates on a semiconductor substrate, forming spacers on the sacrificial gates, forming source/drain regions adjacent to two sacrificial gates separated by a third sacrificial gate, and replacing the two sacrificial gates with metal gates while leaving the third sacrificial gate in place to serve as a dummy gate.
priorityDate 2012-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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