| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_138a26f1c8d17c7e5861082d9fbd5d91 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-027 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-274
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3586 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01D18-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3586
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 |
| filingDate |
2011-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2015-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21ccfd176041898c63052be4703d943d |
| publicationDate |
2015-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9012833-B2 |
| titleOfInvention |
Terahertz wave measuring apparatus and measurement method |
| abstract |
The present invention provides a terahertz wave measuring apparatus and measurement method capable of improving the quantitativeness of obtained frequency spectrum information. In a measurement method in which a terahertz wave measuring apparatus is used, the terahertz wave measuring apparatus measures a time waveform of a terahertz wave relating to a calibration sample whose shape of a calibration spectrum is already known and obtains a measurement spectrum by transforming the time waveform. The calibration spectrum and the measurement spectrum are compared, and, on the basis of results of the comparison, time intervals of measurement data that form a time waveform are adjusted in order to calibrate the terahertz wave measuring apparatus. |
| priorityDate |
2010-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |