Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_bce787970b69aeb08d159e7c101c9ed7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c619effe61ba66c6c64554aabe3dd21a http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6fe0242912b39753f7c9644c5cc1fd66 |
classificationCPCAdditional |
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classificationCPCInventive |
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classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-683 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-165 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-223 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-268 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-66 |
filingDate |
2010-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2015-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c57190341d4a2f24e6082dd37ad7e37b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_06412048d1db100231ea44b8c16bf9a9 |
publicationDate |
2015-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8999798-B2 |
titleOfInvention |
Methods for forming NMOS EPI layers |
abstract |
NMOS transistors having controlled channel strain and junction resistance and methods for the fabrication of same are provided herein. In some embodiments, a method for forming an NMOS transistor may include (a) providing a substrate having a p-type silicon region; (b) depositing a silicon seed layer atop the p-type silicon region; (c) depositing a silicon-containing bulk layer comprising silicon, silicon and a lattice adjusting element or silicon and an n-type dopant atop the silicon seed layer; (d) implanting at least one of the lattice adjusting element or the n-type dopant which is absent from the silicon-containing bulk layer deposited in (c) into the silicon-containing bulk layer; and (e) annealing the silicon-containing bulk layer with an energy beam after implantation in (d). In some embodiments, the substrate may comprise a partially fabricated NMOS transistor device having a source/drain region defined therein. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11649559-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015221730-A1 |
priorityDate |
2009-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |