Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c6b898ccc7a9299a3e5cfae43de0e615 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3879a0f67ef2bf17646d07b5d1461c51 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c7ca0f248fe99c2dd581669f8e9e5f1f http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_063a1b324005ddc15e16e7529c6258c4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ce7b339dc214db2604e7c43a9a55f420 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2560-0276 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-048 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-374 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-374 |
filingDate |
2012-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2014-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cb8c8fff579652f4b22ff709d1b2c8f2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_429e04c978a9aed446645e8c67d81171 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b7ba0b5364dd1a7644283206c7efd61 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b347676306c7f1d0617e08816b01c8aa |
publicationDate |
2014-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8914100-B2 |
titleOfInvention |
Electroencephalogram measurement system, electroencephalogram measurement method, and program thereof |
abstract |
An exemplary electroencephalogram measurement system includes: a frequency analysis section for, analyzing a frequency power of the electroencephalogram signal of a user with respect to each set of a reference electrode and a measurement electrode; an insufficient electrode determination section for, through comparison of the analyzed frequency power against a first threshold value, distinguishing whether a state of attachment of each electrode is sufficient or not; and an insufficiency cause estimation section for determining the number of insufficient electrodes distinguished as insufficiently worn, determining a position at which each insufficient electrode is in contact with the user, and estimating a cause for the insufficient state of attachment of the insufficient electrode or electrodes that corresponds to the determined number of insufficient electrodes and position of each insufficient electrode by referring to insufficiency pattern data. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11116452-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11364361-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11786694-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017112408-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11717686-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11478603-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11452839-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11318277-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10542904-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10835144-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11723579-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11273283-B2 |
priorityDate |
2010-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |