Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-513 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823857 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823842 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0922 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-82345 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-092 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823462 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7843 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7833 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66545 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-49 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-51 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-092 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-49 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8238 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-70 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8234 |
filingDate |
2013-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2014-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_858b89c57c0d4bac68cc3bfbec553e8f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fe0dc0741ddb13d5f81829b53bd5462a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6c0d0275a8d1c4ab527c1e5a06e5ece3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e24ee7aa6294abecea582441d1f118de |
publicationDate |
2014-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8912607-B2 |
titleOfInvention |
Replacement metal gate structures providing independent control on work function and gate leakage current |
abstract |
The thickness and composition of a gate dielectric can be selected for different types of field effect transistors through a planar high dielectric constant material portion, which can be provided only for selected types of field effect transistors. Further, the work function of field effect transistors can be tuned independent of selection of the material stack for the gate dielectric. A stack of a barrier metal layer and a first-type work function metal layer is deposited on a gate dielectric layer within recessed gate cavities after removal of disposable gate material portions. After patterning the first-type work function metal layer, a second-type work function metal layer is deposited directly on the barrier metal layer in the regions of the second type field effect transistor. A conductive material fills the gate cavities, and a subsequent planarization process forms dual work function metal gate structures. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011233065-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10109629-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013005156-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11532624-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11784187-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11289478-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9059314-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10319427-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10177042-B2 |
priorityDate |
2010-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |