http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8650661-B2

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filingDate 2007-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_91a05a9632ba47e7848e8c9fd800e521
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publicationDate 2014-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-8650661-B2
titleOfInvention Method and apparatus for characterizing a probe tip
abstract A method and apparatus are provided of characterizing a re-entrant SPM probe tip ( 30 ) through a single scan of a characterizer, thus dramatically increasing throughput, accuracy, and repeatability when compared to prior known tip characterization techniques. The characterizer also preferably is one whose dimensions can be known with a high level of certainty in order to maximize characterization accuracy. These dimensions are also preferably very stable or, if unstable, change catastrophically rather than in a manner that is difficult or impossible to detect. A carbon nanotube (CNT), preferably a single walled carbon nanotube (SWCNT), has been found to be well-suited for this purpose. Multi-walled carbon nanotubes (MWCNTs) ( 130 ) and other structures may also suffice for this purpose. Also provided are a method and apparatus for monitoring the integrity of a CNT.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019011702-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11237187-B2
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Total number of triples: 40.