| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23ce2cf2afb26cd587f08b85b33a526e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8bd1c8c7b5a2898d09eb99548f140f8c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_325a19ab2c1a37e6e2ae1f97493d1343
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6c50cc218f6fe6365c487923ffedea10 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2894 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F19-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-30 |
| filingDate |
2007-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2014-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ec67020344f122399bc0ff66ac5bb5bf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a945eac9441f0aa206337dfe7e702a79
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ef53231feca20afef1fd24c4ea6ecbd0 |
| publicationDate |
2014-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8626460-B2 |
| titleOfInvention |
Secure test-for-yield chip diagnostics management system and method |
| abstract |
A chip diagnostics management system includes secure design information that define production features of integrated circuit devices and are accessible according to selected levels of access privilege. A database of device defect information includes information of defects of devices produced according to the production features of the design information and associated wafers, production lots, and dies in or with which the devices were produced. A diagnostic manager correlates device defect information from plural wafers with the design information to identify a device location with a probability of being associated with the device defect information. A diagnostic manager viewer indicates the device location together with an amount of design information correlated the level of access privilege assigned to a selected user. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8918753-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9939488-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10267853-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9842185-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10126362-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017176525-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8892972-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017053057-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10247777-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10254335-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8907697-B2 |
| priorityDate |
2006-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |