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publicationDate 2013-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-8569154-B2
titleOfInvention Three dimensional integration and methods of through silicon via creation
abstract A method includes patterning a photoresist layer on a structure to define an opening and expose a first planar area on a sacrificial substrate layer, etching to the exposed first planar area to form a cavity having a first depth in the structure, removing a portion of the photoresist to increase the size of the opening to define a second planar area on the sacrificial substrate layer, forming a doped portion in the sacrificial substrate layer, and etching the cavity to increase the depth of the cavity to expose a first conductor in the structure and to increase the planar area and depth of a portion of the cavity to expose a second conductor in the structure.
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