Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0d12151714492852cbc6ef3ce6d79bff http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_51ea83920fa687e50007860670ffd5ef |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K10-464 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-2032 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K10-481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-60 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-621 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-40 |
filingDate |
2009-12-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2013-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_668c0cb75482a0370ce325dac444f3ae |
publicationDate |
2013-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8546179-B2 |
titleOfInvention |
Method of fabricating a self-aligned top-gate organic transistor |
abstract |
A method of fabricating a self-aligned top-gate organic transistor comprises depositing a photoresist material over the dielectric material, and exposing the photoresist material to irradiation through the substrate using the source and drain electrodes as a mask. The exposure defines a region for deposition of the gate electrode. |
priorityDate |
2008-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |