| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_82e75158c6846899361c6e6c7d2c7f8f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_10ee64090973861bbd496a40b6b375b6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_91fe1cddc99f9255118b5a663deed0fc |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-37247
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-053
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-37241 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-36182
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-3603
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-05
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-0553 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61N1-00 |
| filingDate |
2012-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2013-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eb69a08a1928bd6a7f6e23a1855e18b3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_57361fae44b07608adb9c8db94006fb6 |
| publicationDate |
2013-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8463402-B2 |
| titleOfInvention |
Method and apparatus for determining relative positioning between neurostimulation leads |
| abstract |
A method and neurostimulation control system for operating two leads disposed adjacent tissue of a patient are provided. A plurality of cross-lead electrical parameters are measured to generate a measured electrical profile of the electrode leads. A plurality of cross-lead electrical parameters are estimated to generate a first reference electrical profile for the electrode leads in a first known staggered configuration. The first reference electrical profile is spatially shifted to generate a second reference electrical profile for the electrode leads in a second known staggered configuration. The measured electrical profile is compared to the first and second reference electrical profiles, and a longitudinal stagger between the electrode leads is quantified based on the comparison. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11571579-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11738198-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11103711-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11083887-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11331495-B2 |
| priorityDate |
2009-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |