| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fbd52cfafb51d7ea5cad71d4596e2441
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9baa559a4a83f4f68edad56955ef6601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_354763a8a0cbf4e2168a607853c34a86
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_50d6d18b6be7d07d55d3173f69dff8f6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_70f6adbddcffb5db4db05ee81df844bb |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31935 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31703 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2010-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2013-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4521c9bb11b9918f90da995a41538288
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7bf3953cad18cf869c87c0d916664920
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7b696c14de9b253a301dba26c8b4ea12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7a09d408713118d58cd8e348fc9373b3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e98efe6c6ed0d4904999e27dc26a892e |
| publicationDate |
2013-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8451018-B2 |
| titleOfInvention |
Bit failure signature identification |
| abstract |
A method, system, and program product for identifying at least one bit failure among a plurality of semiconductor chips are provided. A first aspect of the invention provides a method of identifying at least one bit failure signature among a plurality of semiconductor chips, the method comprising: counting failures of each failing bit among the plurality of semiconductor chips; determining a most commonly failing bit (MCFB) among the failing bits; establishing a bit failure signature including the MCFB; counting failures of each failing bit on semiconductor chips on which the MCFB fails; determining a next most commonly failing bit (NMCFB) among the failing bits on semiconductor chips on which the MCFB fails; determining whether the NMCFB tends to fail when the MCFB fails; and in response to a determination that the NMCFB tends to fail when the MCFB fails, adding the NMCFB to the bit failure signature. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10101388-B2 |
| priorityDate |
2010-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |