http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8392138-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_da97127b20673979c6d2fdb991633d1c http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e2c93b5cbb2051aa0bc63999898910ec http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2b6121dedd894b3f760906b68697d616 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B2290-45 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B2290-35 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-3172 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02091 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02004 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B9-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F19-00 |
| filingDate | 2009-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f99b6a1b8f3b91fc277b93008ff1e272 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db75c583df2300def5f1fec48b093d7c |
| publicationDate | 2013-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-8392138-B2 |
| titleOfInvention | System and method for correcting sampling errors associated with radiation source tuning rate fluctuations in swept-wavelength interferometry |
| abstract | The frequency-sampling method is widely used to accommodate nonlinear electromagnetic source tuning in swept-wavelength interferometric techniques, such as optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT). Two sources of sampling errors are associated with the frequency-sampling method. One source of error is the limit of an underlying approximation for long interferometer path mismatches and fast electromagnetic source tuning rates. A second source of error is transmission delays in data acquisition hardware. Aspects of the invention relate to a method and system for correcting sampling errors in swept-wavelength interferometry systems such that the two error sources correct sampling errors associated with the first radiation path and the second radiation path cancel to second order. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112082498-A |
| priorityDate | 2008-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 30.