Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b9d0431643a8821a088efdecd07080e8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_97b25fc350f065dffc29b61d43750106 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2442 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2807 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-164 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-24455 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-24465 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-244 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-02 |
filingDate |
2011-03-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2012-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_56999af9745b2b6ffe44176e64f8d31e |
publicationDate |
2012-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8314386-B2 |
titleOfInvention |
High collection efficiency X-ray spectrometer system with integrated electron beam stop, electron detector and X-ray detector for use on electron-optical beam lines and microscopes |
abstract |
An X-ray spectrometer systems and methods are provided for implementing signal detection for use on electron-optical beam lines and microscopes. The X-ray Spectrometer System (XSS) includes an X-ray detector (XD) measuring the X-ray signal and positioned proximate to a specimen. An environmental isolation window together with an electron beam stop is disposed between XD and the specimen. The environmental isolation window and the electron beam stop protect XD from electrons directly transmitted through the specimen. An electron detector is located between the electron beam stop and the specimen allowing the measurement of scattered electrons. The XD measures an X-ray signal in the X-ray spectrometer system. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10890545-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9349564-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019323977-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3147929-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016118906-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016020062-A1 |
priorityDate |
2010-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |