| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_bc7bd6f0ea7f3f07b89819ebdd9ef30e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3533bdc387e565f1ec8b8ae6938021dc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_96a39edc60a21f2703e796be2a79bf04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_246177252e31835f8fe609ba07015da5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2ff305a2fb2c44b9624fe3ce8f4f870f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-014
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-83102
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-92125
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-32225
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-73204
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-16225
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-3511 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-563
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31816 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-552 |
| filingDate |
2010-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2012-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fbabf5cdb60193cb3dcfcc7f6e732329
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b68656aff30c9b3a691fa3deabe4c0db
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_464955d0b90709279f752df89b26eab5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27c6bde3fb6dc1eab14fa91f7ef27ae0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_930e6f5dbe001984017609845a190213 |
| publicationDate |
2012-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8288177-B2 |
| titleOfInvention |
SER testing for an IC chip using hot underfill |
| abstract |
A method for detecting soft errors in an integrated circuit (IC) due to transient-particle emission, the IC comprising at least one chip and a substrate includes mixing an epoxy with a radioactive source to form a hot underfill (HUF); underfilling the chip with the HUF; sealing the underfilled chip; measuring a radioactivity of the HUF at an edge of the chip; measuring the radioactivity of the HUF on a test coupon; testing the IC for soft errors by determining a current radioactivity of the HUF at the time of testing based on the measured radioactivity; and after the expiration of a radioactive decay period of the radioactive source, using the IC in a computing device by a user. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018358237-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11164756-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11209479-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10586716-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9454886-B2 |
| priorityDate |
2010-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |