| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8f06c9503c2429ce45c88f2a35c1dcaa
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_19d55b10013aec7eaa73c6b6436e07cf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6f8fa8a37290d2eb0217b5ffd97069fc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_17cb2ff1bd6b31f0499a1147f86664fd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4d71ec347760ef0e38b5e0f4da3d93dd |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2009-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2012-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3dc49eb948d2c6bc5d4b24acaff3d9e5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed1106f9422e8b3e86490b5e2b63f371
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c15dbd3bf6d8dfe8be779e65283de30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_da25e7d31c81341caba3e50660dcfee4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7aab8d09786f57cc12edb8471141a06 |
| publicationDate |
2012-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8228088-B1 |
| titleOfInvention |
Automated solar module testing |
| abstract |
Automated testing of solar panel modules employs a gantry system to continuously transfer modules in and out of a workstation where the modules undergo solar simulation current voltage testing and high voltage safety measurements. The gantry system includes a carriage and a clamp device that is adopted to receive and secure the perimeter of each module, which has a positive and negative junction box, located on its back side and contact pins are inserted into the junction boxes during testing. The clamp has an electrically conductive inner perimeter that engages the corresponding outer perimeter of module. High voltage testing determines the level of current leakage between the interior and exterior of the module. A takt time of fifteen seconds or better is achieved. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105356850-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9413174-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/IT-BS20120168-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013181736-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9525381-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102012102456-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013076380-A1 |
| priorityDate |
2009-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |