Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_85b959d2100bb308fcf773d125a37ab8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5c7cba4ecc8b6139e7de82841dd36483 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e83f4ebe302c836fc2cc6769b2c4f81b http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1ed7fd7f598e9259d8deb7969fef8b47 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc52be591f9e01852a7436f151719fec http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd6ddf56897a822ab9be8cc6637febdd |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-4163 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-3274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-327 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-3273 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-487 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-327 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-416 |
filingDate |
2009-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2012-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b697e066508b5b4dc1b647fdde9b2d8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_392402fd05dba07128087d7b08a3848e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cbf2c078b71701cb2985267d3e07c63a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e21ff29d357f80f607da7905175e9b61 |
publicationDate |
2012-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-8092668-B2 |
titleOfInvention |
System and method for quality assurance of a biosensor test strip |
abstract |
The present invention provides a test strip for measuring a signal of interest in a biological fluid when the test strip is mated to an appropriate test meter, wherein the test strip and the test meter include structures to verify the integrity of the test strip traces, to measure the parasitic resistance of the test strip traces, and to provide compensation in the voltage applied to the test strip to account for parasitic resistive losses in the test strip traces. |
priorityDate |
2004-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |