| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b79ea840b038ac1315b2082da00b553b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-12792
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-12753
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2035-00881 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-274
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00712
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-359
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00871 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N35-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 |
| filingDate |
2010-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2011-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c18f7eb92030b37959b00a0395e1491
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89c67c7c70d6dae872bdec57fdaae092
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_79ae4eb11c501bf6977ffdd7a2948ebf |
| publicationDate |
2011-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8010309-B2 |
| titleOfInvention |
On-site analysis system with central processor and method of analyzing |
| abstract |
A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device, a central processor, and a communication link that is connectable between the data acquisition device and the central processor. The central processor is loaded with multivariate calibration models developed for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument variance without instrument-specific calibration transfer. Measurement results generated by the central processor can be transmitted to an output device of a user interface. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016148104-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10349584-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019353792-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2015123615-A1 |
| priorityDate |
2001-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |