| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a18d56bd057a734756316a461ba8260a |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-9046
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-904 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-302 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R33-00 |
| filingDate |
2009-01-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2011-07-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d0c5cd2981be7d1a25fca7fa3fb8b2e1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ba910ea36bcec5c02926159277e43b6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_332ff3500f71207eb12b1763ca181db8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3e89712aef77083cfaf6d5937d34dda5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db9335eea6fa4d1e256a8214d9fa38ca |
| publicationDate |
2011-07-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-7982457-B2 |
| titleOfInvention |
Method and eddy current system for non-contact determination of interface resistance |
| abstract |
The present invention is a method and an eddy current system for non-contact determination of the resistance between the current lead stripe and the coating during continuous fabrication of chemical power sources such as batteries, supercapacitors, photovoltaic modules and the like. Both the method and the non-destructive test system for practicing the method are described. The method includes placing of an integrated measuring transducer containing two strap-type eddy current probes above the surface of the coating applied to the metallic current lead stripe in the region of the shaft guiding the stripe movement, so that all the points of the operating surface of the transducer being at an equal distance from the stripe surface coating so that the two probes would take measurements on the same area of the coating. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9453878-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9721854-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2020182814-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11442033-B2 |
| priorityDate |
2005-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |