Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d380ea394238f732e0ab98fa00bad429 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-535 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-528 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-41758 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0207 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-4238 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0696 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7816 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-118 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-105 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 |
filingDate |
2006-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2011-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49d28c6d85d1103db070c86d66ca65aa |
publicationDate |
2011-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-7956384-B2 |
titleOfInvention |
Closed cell configuration to increase channel density for sub-micron planar semiconductor power device |
abstract |
A semiconductor power device supported on a semiconductor substrate that includes a plurality of transistor cells, each cell has a source and a drain region disposed on opposite sides of a gate region in the semiconductor substrate. A gate electrode is formed as an electrode layer on top of the gate region for controlling an electric current transmitted between the source and the drain regions. The gate electrode layer disposed on top of the semiconductor substrate is patterned into a wave-like shaped stripes for substantially increasing an electric current conduction area between the source and drain regions across the gate. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8561004-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013221437-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9337284-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011186930-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8836029-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10388784-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8937351-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10121668-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10014321-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9941159-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9449919-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I619253-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016133645-A1 |
priorityDate |
2006-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |