| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5bc5292a07e34d16eb1d033a16d3aec3 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-904
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-949 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y15-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y20-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y35-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-086 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-10 |
| filingDate |
2009-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2011-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1088a8907bf37d510d4dc5207c06b42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b52ab356ff2015fd634c0f51c1f1bc53
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b3482a56e6280830044e3fc23cfee0e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_446576577830dfd86e1efad068f3e03d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ea5714db13046fd179d2b79fc97f71f8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_626219e34809245b54bd2159627a2bcf |
| publicationDate |
2011-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-7929132-B2 |
| titleOfInvention |
Transmission microscopy using light emitted from nanoparticles |
| abstract |
Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11543338-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11385157-B2 |
| priorityDate |
2008-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |