| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc3e639586089fe232d0cfb27383c875 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02827
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0256
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0094
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02818
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0426 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-022
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-4472
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N5-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N5-02 |
| filingDate |
2006-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2011-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8a0f0bca6d87006bbafbe90bd9b0f6ce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_09b0bdc8574cfdcd1dd050d886b8af37 |
| publicationDate |
2011-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-7874211-B2 |
| titleOfInvention |
Measuring method and measuring device using quartz oscillator |
| abstract |
An object of the present invention is that any of mass load, viscous load and viscoelasticity load is measured separately from other load whereby properties of the substance to be measured are able to be measured correctly. n The characteristic feature of the present invention is that, in a method where property of a substance contacting to a quartz oscillator equipped with electrodes on both sides of a quartz plate is measured on the basis of the changes in frequency of the above quartz oscillator, the property of the above substance is measured using at least two frequencies among the n-th overtone mode frequency (n=1, 3, 5, . . . (n=2k+1)) of quartz oscillator when voltage is applied between the above electrodes and using frequencies F 1 , F 2 (F 1 <F 2 ) giving one half of the maximum value of conductance near the resonant point by each frequency. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013046487-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9146187-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2011140485-A1 |
| priorityDate |
2005-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |