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publicationDate 2010-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7790591-B2
titleOfInvention Methods of manufacturing semiconductor devices including metal oxide layers
abstract Methods of manufacturing a semiconductor device are provided including forming a charge storage layer on a gate insulating layer that is on a semiconductor substrate. A blocking insulating layer is formed on the charge storage layer and an electrode layer is formed on the blocking insulating layer. The blocking insulating layer may be formed by forming a lower metal oxide layer at a first temperature and forming an upper metal oxide layer on the lower metal oxide layer at a second temperature, lower than the first temperature.
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