| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23a4e0c875bf1ac2b8a3b76517de6c7d |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q40-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B3-30 |
| filingDate |
2008-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2010-05-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_af52baaf8d6cb7f6c9a58ca099a88342 |
| publicationDate |
2010-05-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-7721587-B2 |
| titleOfInvention |
System and method for improving the precision of nanoscale force and displacement measurements |
| abstract |
An apparatus and method for improving the precision of nanoscale force and/or displacement measurements using electro micro metrology (EMM). |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9304072-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9404841-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012266666-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9335240-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104684841-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10184851-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9408555-B2 |
| priorityDate |
2007-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |