http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7486094-B2

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8e8de676cc01e2f6d50c6ef4be8f000b
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2005-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2009-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fad85955f14408d602ad66f26eba50f
publicationDate 2009-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7486094-B2
titleOfInvention Apparatus for testing un-moulded IC devices using air flow system and the method of using the same
abstract An apparatus minimizes stress on un-moulded IC devices by use of an airflow system. A vacuum urges the DUT's into contact with the pivoted test fingers, thereby reducing damage to the IC. A fitting is connected to a vacuum pump which draws out air and creates a vacuum chamber in the area created by the lift/support and the test socket, thereby causing the supported un-moulded DUTs to move upward towards the test socket and into physical contact with the test pins. The index time is decreased in order to improve overall operating efficiency and costs of the test apparatus.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11719743-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101494171-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10157767-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11061069-B2
priorityDate 2004-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985

Total number of triples: 18.