http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7486094-B2
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8e8de676cc01e2f6d50c6ef4be8f000b |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2005-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2009-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fad85955f14408d602ad66f26eba50f |
publicationDate | 2009-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | US-7486094-B2 |
titleOfInvention | Apparatus for testing un-moulded IC devices using air flow system and the method of using the same |
abstract | An apparatus minimizes stress on un-moulded IC devices by use of an airflow system. A vacuum urges the DUT's into contact with the pivoted test fingers, thereby reducing damage to the IC. A fitting is connected to a vacuum pump which draws out air and creates a vacuum chamber in the area created by the lift/support and the test socket, thereby causing the supported un-moulded DUTs to move upward towards the test socket and into physical contact with the test pins. The index time is decreased in order to improve overall operating efficiency and costs of the test apparatus. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11719743-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101494171-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10157767-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11061069-B2 |
priorityDate | 2004-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985 |
Total number of triples: 18.