http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7328383-B2

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-317
filingDate 2006-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2008-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5fde8224a8ec447cec16dbac7f7c3043
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publicationDate 2008-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7328383-B2
titleOfInvention Circuit and method for testing embedded phase-locked loop circuit
abstract In a method for testing an embedded phase-locked loop (PLL) circuit, a first clock signal is provided to an embedded phase-locked loop (PLL) circuit to be tested. A PLL clock signal of a first frequency is generated by the embedded PLL in response to the first clock signal. The PLL clock signal of the first frequency is sampled with a second clock signal of a second frequency to generate a first sampled signal, wherein the second frequency is different from the first frequency but has a first correlation with the first frequency so that the first sampled signal toggles at a predetermined frequency when the embedded PLL circuit is in a normal operation condition. The embedded PLL circuit is determined to be in an abnormal operation condition if the first sampled signal does not toggle at said predetermined frequency.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8749038-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10868551-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009190706-A1
priorityDate 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 24.