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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B9-02
filingDate 2004-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2007-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bcc97911eb628ecdadcc96933177246b
publicationDate 2007-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7298492-B2
titleOfInvention Method and system for on-line measurement of thickness and birefringence of thin plastic films
abstract A system and method for analyzing the characteristics of a thin film is provided whereby the in-plane birefringence of thin films is determined by measuring the interference fringes in the transmission or reflection spectra using unpolarized light and light linearly polarized along the MD and CD directions. The three spectra can be measured simultaneously or sequentially. The in-plane birefringence data can be used to characterize clear polymer films, which are principally made of biaxial oriented polymer, as the film is being continuously fabricated on a production line.
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priorityDate 2004-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 43.