http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7176704-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0458 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04 |
| filingDate | 2004-04-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2007-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32d77b00a0734c8d6f29759e8f49caca http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0263dc67f5c888e3714819d435a18dd7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_64ca2c0fa9a0d0b9690c76816f5eb32b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_964b98d037e56aba159b2985ad5c0e7d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_60faa9ef7e231d9ed1b12b8580285a32 |
| publicationDate | 2007-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-7176704-B2 |
| titleOfInvention | Inspecting apparatus for semiconductor device |
| abstract | An inspecting apparatus for semiconductor devices including: a match plate; a contact module combined with the match plate, and the match plate including a radiation unit radiating heat from the semiconductor devices to the outside, and a test unit contacting leads of the semiconductor; an insert module installed on a bottom of the contact module, and having a semiconductor device accommodator to accommodate the semiconductor device; and an auxiliary radiation member installed on a bottom of the insert module, and radiating the heat from the semiconductor device to the outside. Accordingly, the inspecting apparatus for semiconductor device according to the present invention performs testing at a constant temperature regardless of heat from the semiconductors by radiating the heat from the semiconductors immediately and efficiently, thereby producing more accurate test results. Accurate testing improves productivity and saves expense by removing faulty test results caused by identifying a qualified semiconductor as a defective semiconductor due to heat radiated from the semiconductor device. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2004260503-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7283931-B2 |
| priorityDate | 2003-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.