http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7164480-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a5be2120a26ac1541644ace17a0da048 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-1086 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0056 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0024 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B27-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B9-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B17-08 |
| filingDate | 2004-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2007-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_46354075beafa2779dbaeaca1a2f14fe |
| publicationDate | 2007-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-7164480-B2 |
| titleOfInvention | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
| abstract | An interferometric microscope for making interferometric measurements of locations within an object that is in a medium, there being a mismatch between indices of refraction of said object and said medium, the microscope including a source for generating an input beam; an interferometer which is configured to receive the input beam and generate therefrom a measurement beam, to focus the measurement beam onto a selected spot in the object and produce for that selected spot a return measurement beam, and to combine the return measurement beam and a reference beam to produce an interference beam; and a detector system which is positioned to receive the interference beam, wherein the return measurement beam travels along a path from the object to the detector system and wherein the interferometer includes a compensating layer of material positioned in the path of the return measurement beam, the compensating layer producing a mismatch in the index of refraction along the path of the return measurement beam that compensates for the mismatch between the indices of refraction of the object and the medium. |
| priorityDate | 2003-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 32.