http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7138804-B2

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R29-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-60
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G08C19-16
filingDate 2004-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9b0bd4640bfe4a09ed7ff8bf72b783e
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publicationDate 2006-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7138804-B2
titleOfInvention Automatic transmission line pulse system
abstract A system for measuring electrostatic discharge (ESD) characteristics of a semiconductor device that comprises at least one pulse generator generating ESD-scale pulses, a first point of the semiconductor device receiving a first ESD-scale pulse from the at least one pulse generator, a second point of the semiconductor device receiving the first ESD-scale pulse from the at least one pulse generator, at least a third point of the semiconductor device receiving a second ESD-scale pulse from the at least one pulse generator, and a data collector to collect data on the ESD characteristics of the semiconductor device.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9448269-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9435841-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014347061-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8026736-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10359461-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010165537-A1
priorityDate 2003-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.