| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_421cadb30fc0074fe61126eb980d19d6 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-428
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-424
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0009
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-004 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B01D59-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J41-04 |
| filingDate |
2004-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2006-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eb388756a72ba55bb710057550d658e2 |
| publicationDate |
2006-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-7138624-B2 |
| titleOfInvention |
Method for accurate mass determination with ion trap/time-of-flight mass spectrometer |
| abstract |
Accurate mass measurement is carried out for product ions of a sample. A method for accurate mass determination of ions with Trap-TOF/μs includes steps of generating ions of an analyte sample and a standard material; introducing the ions of the analyte sample and the standard material together into an ion trap to trap them; selecting a precursor ion from the ions of the analyte sample to leave the precursor ion and a standard material ion in the ion trap and eliminate other ions; exciting and dissociating the precursor ion to generate product ions; ejecting the precursor ion, its product ions, and the standard material ion trapped in the ion trap to introduce these ions into the TOF mass spectrometer; and measuring a mass spectrum with the TOF mass spectrometer, where correction for accurate masses of the product ions is carried out based on the standard material ion measured. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2633513-C2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011189788-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010237236-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9076638-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011049346-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8309911-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7282708-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10079136-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012223223-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005236578-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008073513-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10714325-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9080936-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9500607-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9991103-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7375318-B2 |
| priorityDate |
2003-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |