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filingDate 2003-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationNumber US-7122391-B2
titleOfInvention Wafer-level test structure for edge-emitting semiconductor lasers
abstract Wafer-level stage testing of semiconductor lasers can be facilitated by directing a light beam emitted from the semiconductor laser toward a direction different from a path of the light beam as originally emitted from the laser. A test structure can be coupled to a back facet of the laser and can include a first region separated from a second region by an inclined interface. When a light beam is emitted from the laser, the light beam can be received on the inclined interface and then directed toward a light detector for detection and evaluation.
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