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filingDate 2002-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db716440f1708648936d3abff61ea325
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publicationDate 2006-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7027939-B2
titleOfInvention Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles
abstract A circuit for detecting a defect of electronic components in an electronic control unit includes an output for driving a load ( 3 ). A redundant measurement of the current (I L ) is executed at the contacts (G, S, D), in particular at the driven contacts (S, D), of one or more semiconductor circuit elements, and an error function of a semiconductor circuit element is detected when the comparison of two current values (I S , I Sense1 , I Sense2 ) by way of the current flowing through a load ( 3, 3 ′) indicates an unequal current distribution. This circuit is of use in electronic brake force or driving dynamics controllers for motor vehicles.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010204879-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2023221742-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7485984-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006091722-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8704508-B2
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