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assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b36b04a48575d56eac6b8fb1d967278c |
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0847 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0878 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66681 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42368 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-1095 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7816 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0634 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-06 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-58 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 |
filingDate |
2003-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2005-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1aecbc88a11bf3a2e0b88d68525d8fe http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_54ca071417c121eff29a2fc32bf17af5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fc307ff3e2afbf3d498d793220c32538 |
publicationDate |
2005-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-6979875-B2 |
titleOfInvention |
Reduced surface field technique for semiconductor devices |
abstract |
A power device and a method for manufacturing the same are provided. The power device comprises a first conductive semiconductor substrate; a second conductive buried layer formed to a certain depth within the semiconductor substrate; a second conductive epitaxial layer formed on the conductive buried layer; a first conductive well formed within the conductive epitaxial layer; a second conductive well formed within the second conductive epitaxial layer, on both sides of the first conductive well; a second conductive drift region formed in predetermined portions on the first and the second conductive well; and a lateral double diffused MOS transistor formed in the second conductive drift region. The breakdown voltage of the power device is controlled according to a distance between the first conductive well and the second conductive buried layer. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010258867-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010019318-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9196680-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008237707-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9196681-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011241114-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7999315-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8816434-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015243776-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9224862-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8847332-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102008038300-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011012204-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010219471-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7977715-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010245369-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8143691-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9660072-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010163989-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10229993-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8269277-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8912598-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10896954-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011127607-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009230468-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8008726-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8431990-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008138954-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8232596-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006145249-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009117279-A3 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010065909-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009117279-A2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101098161-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012267715-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10153213-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7655980-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8349717-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8362557-B2 |
priorityDate |
2002-05-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |