http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6825120-B1

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76877
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-7684
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 2002-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2004-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2f3c97d8cb3114cf9c8349181c60fa9b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d6a42541e19c5bacc5ea7b2088bf9752
publicationDate 2004-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6825120-B1
titleOfInvention Metal surface and film protection method to prolong Q-time after metal deposition
abstract The present invention relates to a method of protecting a fresh metal surface, preferably copper, after a metal deposition step. The metal deposition is preferably part of single or dual damascene process. The metal surface is treated with an amine, preferably BTA, to form a metal complex that is a hydrophobic monolayer and prevents the underlying metal from reacting to form oxides that can degrade device performance. The amine can be applied in various ways including dipping, spraying, spin coating, and by a CVD method. The sacrificial protective layer can remain on the substrate during a storage period of up to hours or days before it is removed in a subsequent chemical mechanical polish step. The use of a sacrificial protective layer improves throughput in a damascene process by allowing long queue times between metal deposition and CMP which gives more flexibility to production flow and reduces cost.
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priorityDate 2002-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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