Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6307e62bbc5f81c5810d78ceb37b47b5 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06772 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y15-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06705 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R35-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R35-00 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2003-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2004-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fe95591822896283ea822a64cd5ebdd3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45a61515133aee93ab4b390cf99a14fb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8808fda3b3a358a2b3c80a1a50dab9ed http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2fe7530b6d15c3ab9e3f0a9ed34ead8e |
publicationDate |
2004-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-6803779-B2 |
titleOfInvention |
Interconnect assembly for use in evaluating probing networks |
abstract |
An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7969173-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8319503-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7180314-B1 |
priorityDate |
1995-04-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |