http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6797958-B2

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_887e125008cf84c53554d9e68cf7f02b
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-0633
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06
filingDate 2002-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2004-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9bee73db6288ec73116ac09374455e50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_99c12a5c082b74a9284c8bcf57d594f1
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publicationDate 2004-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6797958-B2
titleOfInvention Method of measuring sol-gel coating thickness using infrared absorbance
abstract A nondestructive method is provided for efficiently determining thickness of a sol-gel coating formed upon a metallic substrate. A value of infrared energy reflected from the metallic substrate without the sol-gel coating is determined. A value of infrared energy reflected from the metallic substrate with the sol-gel coating is determined. A value of infrared energy absorbed in the sol-gel coating is determined, and a value of the infrared energy absorbed in the sol-gel coating is correlated to a thickness of the sol-gel coating.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2671927-C1
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priorityDate 2002-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 26.