| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_144438cdfd820cd50dd7339af61aa3ed
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a2bcaf91101a370a3d64e3190366357f |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-4788
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-30 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-956
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-00 |
| filingDate |
2001-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2004-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34644c08c1ac055fbfabc37bc7fa42b8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_876b9ed749612576841a13ebfcaa8ae6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_71c3fc989184e271edece8fa95559f04 |
| publicationDate |
2004-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-6724475-B2 |
| titleOfInvention |
Apparatus for rapidly measuring angle-dependent diffraction effects on finely patterned surfaces |
| abstract |
An apparatus for measuring angle-dependent diffraction effects includes a coherent radiation source, a device for deflecting the coherent radiation in different directions, a spherical or aspherical mirror or mirror segments configured to correspond to a spherical or aspherical mirror, and a detector unit for measuring the intensity of the radiation diffracted at a specimen. The radiation deflected in different directions is reflected by the mirror configuration in such a way that the coherent beam is deflected onto the specimen with different angles of incidence in a temporally successively sequential manner. For this purpose, the angle of incidence of the measuring beam is altered continuously or in small steps. The intensities of the direct reflection (zero-order diffraction) and also of the higher orders of diffraction that may occur are measured. This evaluation allows conclusions to be drawn regarding the form and material of the periodic structures examined. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007091325-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11327012-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7292341-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7525672-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108956093-A |
| priorityDate |
1999-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |