http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6521922-B1

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_aea8583efc4aa4e2a9706d789804d37b
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76832
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76837
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-72
filingDate 2000-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2003-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_48c0938316476c13c32794d059569ff9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f3744c7479948e2afcbedb08b847311a
publicationDate 2003-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6521922-B1
titleOfInvention Passivation film on a semiconductor wafer
abstract The present invention provides a passivation film on a semiconductor wafer. The semiconductor wafer comprises a dielectric layer and a patterned conductive layer on the dielectric layer. The passivation film comprises a high density plasma (HDP) oxide layer positioned on the surface of the conductive layer and on the surface of the dielectric layer that is not covered by the conductive layer, a silicon nitride layer positioned on the HDP oxide layer, and a water-resistant layer positioned on the silicon nitride layer. The HDP oxide layer possesses good gap filling abilities to fill the spaces inside the conductive layer.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005262988-A1
priorityDate 2000-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 42.