| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5547f741b25666fc4ae5195cf71a979b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R2201-20 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R12-7076
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01R13-2414 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R33-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R11-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R13-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R43-00 |
| filingDate |
2001-02-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2002-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc420ee9aee3532c5de70ad8fb686bbb |
| publicationDate |
2002-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-6422879-B2 |
| titleOfInvention |
IC socket for surface-mounting semiconductor device |
| abstract |
An IC or testing socket is provided, which ensures stable electrical connection of an IC or semiconductor device to be tested to the circuit board of a test apparatus. This socket comprises: (a) a socket body made of a rigid material; the body having penetrating openings; (b) anisotropically conductive members formed in the respective openings of the body; each of the anisotropically conductive members being made of an elastic, insulating material, first conductive particles dispersed in the material, and second conductive particles dispersed in the material; the first and second conductive particles being different in average diameter from each other; and (c) a guide for receiving a semiconductor device to be tested and guiding the device toward the conductive members in the body; the guide being fixed to the body in such a way that electrodes of the device are contacted with the corresponding conductive members in the body. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100952712-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10470315-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009128619-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8334595-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016126024-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101525520-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7790987-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2002191406-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006243480-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101019721-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-100437838-C
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7267559-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007293062-A1 |
| priorityDate |
2000-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |