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filingDate 1997-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2000-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ac9dfbf1d76cfdd090387560214e94f
publicationDate 2000-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6133465-A
titleOfInvention Pattern formation method and surface treatment agent
abstract A surface of a semiconductor substrate of silicon is supplied with 4-trimethylsiloxy-3-penten-2-one serving as a surface treatment agent. Thus, H in OH groups existing on the surface of the semiconductor substrate is substituted with Si(CH3)3 (i.e., a trimethylsilyl group), resulting in producing CH3COCH2COCH3 (i.e., acetylacetone). Then, the surface of the semiconductor substrate is coated with a resist, exposed by using a desired mask, and subjected successively to PEB and development, thereby forming a resist pattern thereon. Since the surface of the semiconductor substrate is treated with 4-trimethylsiloxy-3-penten-2-one, the surface of the semiconductor substrate is made to be hydrophobic, so that the adhesion of the semiconductor substrate can be improved. As a result, the resultant resist pattern has a satisfactory shape free from peeling.
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