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filingDate 1997-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2000-08-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6103560-A
titleOfInvention Process for manufacturing a semiconductor device
abstract Implantation of a high concentration of P type impurity in an emitter electrode can be prevented during forming a source-drain of PMOS and a extrinsic base, by keeping an insulating film intact only on an emitter electrode and simultaneously patterning the insulating electrode and a gate electrode, leading to prevention of increase and dispersion of an emitter resistance.
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