| abstract |
Apparatus for IR and Raman analysis of a sample includes an optical train having a common path segment that includes the sample, and a mechanism for selectively or simultaneously) subjecting the sample to analytic radiation (such as IR) or Raman excitation radiation, and selectively (or simultaneously) detecting the analytic radiation from the sample or the Raman scattered light from the sample. In a specific embodiment, the apparatus includes a sample stage for holding the sample; an infrared source; an infrared detector; a source of Raman excitation light; a Raman spectrometer; infrared and visible (Raman) light objectives selectively positionable in the common path segment; an optical train disposed in the common path segment for transferring light between the sample and a particular location; and a mechanism for selectively (or simultaneously) (a) directing analytical radiation to the sample and analytical radiation from the sample to the infrared detector, or (b) directing Raman excitation light to the sample and Raman scattered light to the Raman spectrometer. The mechanism can be a movable mirror or a fixed dichroic beam splitter. |