| abstract |
The electrically rewritable nonvolatile semiconductor memory device includes a plurality of memory cells arranged in rows and columns, a decoder circuit for selecting at least one of the plurality of memory cells, a writing circuit for writing data in the selected memory cell through the decoder circuit, a reading circuit for reading the data from the selected memory cell, a detecting circuit for detecting a change of the threshold voltage of each of the non-selected memory cells, which change is caused by a voltage applied to the non-selected memory cell when writing the data in the selected memory cell, and a restoring circuit for restoring the threshold voltage of the non-selected memory cell a value equal to or near to its original value on the basis of the result of the above detection. |