| abstract |
A demand modulated electrothermal atomization plasma spectroscopy system intended to reliably and controllably atomize samples. The invention is used in conjunction with a plasma spectroscopic instrument, and includes a feedback control loop that monitors the rate of analyte consumption in a plasma torch and regulates the temperature of an electrothermal atomization means that supplies analyte material to the plasma torch. The feedback system in the preferred embodiment regulates atomization temperature based upon ion or photon count rates. |