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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L9-00
filingDate 1988-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1990-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1c817c8c5efd32a6f99ddd34cf7f42e0
publicationDate 1990-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4924701-A
titleOfInvention Pressure measurement system
abstract A pressure measurement system comprising a capacitance device whose outer interrelated capacitance plates are maintained in a relatively fixed position relative to one another while an intermediate capacitance plate responds to temperature. The plates are in a restricted enclosure containing a gas dielectric medium. The pressure of the gas dielectric medium (and consequently the density of the gas) is controlled as a function of a pressure to be measured. By measurement of capacitance relationships as a function of the temperature and density of the gas dielectric medium, a pressure measurement is obtained. The system is constructed with like types of materials where the capacitance device is in an enclosure chamber which is immersed in a pressure media. The capacitance device is constructed with a symmetrical arrangement to balance out effects of gravity or vibration. Construction of micro components utilizes an electrostatic bonding system which eliminated arcing during bonding.
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