http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4912417-A

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-26
filingDate 1989-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1990-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_271584195aca6a1879b5f712c0b71dc5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_97e6ffbfeb712632680baf90ce6b8226
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publicationDate 1990-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4912417-A
titleOfInvention Measurement of pH and specific ion concentration
abstract A microprocessor-controlled pH and ion concentration meter is disclosed with improved calibration and testing procedures. For calibration (standardization), the meter stores number pairs (pX a , E a ), (pX b , E b ) where the pX values may be pH values (e.g., 4.00 and 7.00) and the E values are expressed in mV/deg K. When multiple standard values are stored, remeasuring one (e.g., replacing E a1 by E a2 ) can be used to update the others (e.g., E b1 to E b2 ) without remeasurement by applying the formula: n n E.sub.b2 =E.sub.b1 +(E.sub.a2 -E.sub.a1). n n Additionally, the meter can be tested for excessive internal bias current by measuring the potential (V1) when the meter is connected to a circuit of low impedance and the potential (V2) when the meter is connected to a circuit of the same voltage source but of known high impedance and having the meter compare (V2-V1) to a preset limit value.
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priorityDate 1989-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 55.